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High-performance one-stage detector for SiC crystal defects based on convolutional neural network.
Haochen Shi
Zhiyuan Jin
Wenjing Tang
Jing Wang
Kai Jiang
Mingsheng Xu
Wei Xia
Xiangang Xu
Published in:
Knowl. Based Syst. (2023)
Keyphrases
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convolutional neural network
face detection
databases
defect detection
detection method
software development life cycle
defect classification
neural network
social networks
knowledge base
image processing
feature extraction
general purpose