Login / Signup

IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test.

Katherine Shu-Min LiYi-Yu Liao
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
  • real world
  • high speed
  • databases
  • test data
  • statistical tests
  • statistical significance
  • genetic algorithm
  • learning algorithm
  • knowledge base
  • data streams
  • low cost
  • software testing