Feature space monitoring for smart manufacturing via statistics pattern analysis.
Q. Peter HeJin WangDevarshi ShahPublished in: Comput. Chem. Eng. (2019)
Keyphrases
- pattern analysis
- feature space
- pattern recognition
- monitoring system
- image analysis
- real time
- feature selection
- wireless sensor
- high dimensional
- image retrieval
- computational intelligence
- principal component analysis
- low dimensional
- dissimilarity measure
- mean shift
- feature vectors
- smart environments
- image representation
- training samples
- data points
- manufacturing processes
- support vector machine
- classification accuracy
- training set
- feature extraction
- manufacturing systems
- health monitoring
- production planning
- input space
- high dimensional feature space
- decision support
- process planning
- manufacturing industry
- continuous monitoring
- quality control
- pattern classification
- kernel methods
- signal processing
- dimensionality reduction
- image processing
- computer vision