Embedded Test for Highly Accurate Defect Localization.

Abdullah Mumtaz Michael E. Imhof Stefan Holst Hans-Joachim Wunderlich

Published in: Asian Test Symposium (2011)

Keyphrases

highly accurate
capable of producing
high quality
high accuracy
test data
embedded systems
accurate models
data sets
data mining
learning environment
test cases
statistical significance
source localization