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Validation on Duality in Impact-ionization Carrier Generation at the Onset of Snapback in Power MOSFETs.

Takahiro IizukaHiroyuki HashigamiMitiko Miura-MattauschHans Jürgen Mattausch
Published in: ISDCS (2019)
Keyphrases
  • linear programming
  • power consumption
  • real time
  • real world
  • knowledge base
  • natural language
  • artificial neural networks
  • special case
  • generation algorithm
  • high impact
  • power distribution