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Effects of device aging on microelectronics radiation response and reliability.

Daniel M. FleetwoodM. P. RodgersL. TsetserisX. J. ZhouI. BatyrevS. WangRonald D. SchrimpfSokrates T. Pantelides
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • software aging
  • x ray
  • infrared
  • real time
  • feature extraction
  • neural network
  • social networks
  • feature vectors
  • failure rate