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Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection.

David LinTed HongYanjing LiEswaran SSharad KumarFarzan FallahNagib HakimDonald S. GardnerSubhasish Mitra
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2014)
Keyphrases
  • error detection
  • error correction
  • high speed
  • high density
  • error recovery
  • computer systems
  • fault tolerance
  • error control