Topology-Driven Reliability Assessment of Integrated Circuits.

Theodor Hillebrand Steffen Paul Dagmar Peters-Drolshagen

Published in: MIXDES (2018)

Keyphrases

integrated circuit
reliability assessment
bp neural network model
power system
data driven
electron beam
multiscale
data sets
artificial intelligence
image segmentation
three dimensional
image analysis
low cost
regression model
printed circuit boards