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Faster-than-at-speed test for increased test quality and in-field reliability.
Tomokazu Yoneda
Keigo Hori
Michiko Inoue
Hideo Fujiwara
Published in:
ITC (2011)
Keyphrases
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real world
machine learning
genetic algorithm
information systems
decision trees
multiresolution
high speed
test data
higher quality
statistical significance