Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip.
Vikram IyengarKrishnendu ChakrabartyErik Jan MarinissenPublished in: IEEE Trans. Computers (2003)
Keyphrases
- data sets
- high quality
- data analysis
- test data
- raw data
- data reduction
- data sources
- knowledge discovery
- test cases
- synthetic data
- data processing
- data collection
- statistical significance
- computer systems
- data mining techniques
- data distribution
- prior knowledge
- original data
- training data
- input data
- optimization algorithm
- high dimensional data
- image data
- missing data
- end users
- learning algorithm