Login / Signup
Optimization of Test Wrapper for TSV Based 3D SOCs.
Surajit Kumar Roy
Chandan Giri
Hafizur Rahaman
Published in:
J. Electron. Test. (2016)
Keyphrases
</>
optimization algorithm
global optimization
optimization process
feature selection
optimization problems
black box
statistical significance
support vector
information extraction
joint optimization
linear programming
test cases
test data
optimization methods