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Efficient BISR Techniques for Embedded Memories Considering Cluster Faults.
Shyue-Kung Lu
Chun-Lin Yang
Yuang-Cheng Hsiao
Cheng-Wen Wu
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
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data mining
information systems
fault diagnosis
real time
neural network
machine learning
artificial intelligence
search algorithm
digital images
lightweight
cost effective
computationally expensive
fault detection
root cause