Pseudo-exhaustive word-oriented DRAM testing.

Mark G. Karpovsky Ad J. van de Goor V. N. Yarmolik

Published in: ED&TC (1995)

Keyphrases

co occurrence
data sets
test set
test cases
n gram
word sense disambiguation
high density
natural language text
machine learning
data model
management system
text classification
exhaustive search
sentence level
early vision