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Stress-Aware Periodic Test of Interconnects.

Somayeh Sadeghi KohanSybille HellebrandHans-Joachim Wunderlich
Published in: J. Electron. Test. (2021)
Keyphrases
  • real world
  • probabilistic model
  • input output
  • three dimensional
  • lower bound
  • test data
  • experimental design