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Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs.

Tetsuya SuemitsuYoshino K. FukaiHiroki SugiyamaKazuo WatanabeHaruki Yokoyama
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • data sets
  • cooperative
  • search algorithm
  • genetic algorithm
  • learning algorithm
  • image segmentation
  • high level
  • feature extraction
  • training data
  • mobile devices
  • multiresolution
  • response time