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Early degradation of high power packaged LEDs under humid conditions and its recovery - Myth of reliability rejuvenation.

Preetpal SinghCher Ming TanLiann-Be Chang
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • high power
  • low power
  • high density
  • power supply
  • error detection
  • data center
  • ofdm system
  • power consumption
  • high speed
  • data fusion
  • high frequency