On the Fault Testing for Reversible Circuits.

Satoshi Tayu Shigeru Ito Shuichi Ueno

Published in: ISAAC (2007)

Keyphrases

fault diagnosis
markov chain
high speed
cellular automata
fault detection
fault model
circuit design
database
data sets
image sequences
fuzzy logic
real time embedded systems
analog vlsi
delay insensitive
machine learning
real world
real time