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An analytical model for discretized doped InAlAs/InGaAs heterojunction HEMT for higher cut-off frequency and reliability.

Ritesh GuptaSandeep k. AggarwalMridula GuptaR. S. Gupta
Published in: Microelectron. J. (2006)
Keyphrases
  • analytical model
  • analytical models
  • bit error rate
  • data sets
  • simulation model
  • lower bound
  • reliability analysis
  • databases
  • data mining
  • case study
  • control system
  • signal to noise ratio