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A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect.

Jun-Yang LeiThomas MoonJustin ChowSuresh K. SitaramanAbhijit Chatterjee
Published in: ATS (2018)
Keyphrases
  • lightweight
  • low cost
  • high speed
  • test suite
  • three dimensional
  • test cases
  • software testing