A hierarchical defect repair approach for hybrid nano/CMOS memory reliability enhancement.
Mehdi HabibiHossein PourmeidaniPublished in: Microelectron. Reliab. (2014)
Keyphrases
- power consumption
- failure rate
- random access memory
- image enhancement
- memory size
- nano scale
- high speed
- memory usage
- hierarchical structure
- computing power
- image processing
- analog vlsi
- reliability analysis
- random access
- computational power
- memory requirements
- real time
- quality control
- low power
- associative memory
- memory space
- image sensor
- hierarchical clustering
- resource consumption
- single chip
- main memory
- integrity constraints
- database management systems
- video sequences