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A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology.
Choongyeun Cho
Daeik D. Kim
Jonghae Kim
Jean-Olivier Plouchart
Daihyun Lim
Sangyeun Cho
Robert Trzcinski
Published in:
ISQED (2007)
Keyphrases
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data driven
silicon on insulator
data processing
rapid development
statistical information
database
neural network
real world
image processing
multimedia
decision trees
computer systems
statistical analysis
infrared
process model
key technologies