Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System.
Michael CatalanoRichard K. FeldmanRoberto KrutianskyRichard SwanPublished in: ITC (1983)
Keyphrases
- signal processing
- high accuracy
- wide range
- computational cost
- classification accuracy
- neural network
- low snr
- fold cross validation
- high precision
- camera calibration
- test cases
- prediction accuracy
- shortest path
- data sets
- test data
- computational complexity
- computational efficiency
- error analysis
- optimal path
- image processing
- vlsi design
- false positive and false negative
- camera setup