Visual inspection of surface defects of extreme size based on an advanced FCOS.

Hui Shi Rui Lai Gangyan Li Wenyong Yu

Published in: Appl. Artif. Intell. (2022)

Keyphrases

visual inspection
printed circuit boards
image analysis
surface defects
registration accuracy
laser scanning
neural network
real time
image processing
high quality
viewpoint
machine vision
fluorescence microscopy images