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Evaluation of wire bonding performance, process conditions, and metallurgical integrity of chip on board wire bonds.

Daniel T. RooneyDeePak NagerDavid GeigerDongkai Shanguan
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • wire bonding
  • bond pad
  • evaluation process
  • process model
  • data sets
  • low cost
  • image analysis
  • sufficient conditions
  • numerical simulations
  • process control
  • stress response