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Screening small-delay defects using inter-path correlation to reduce reliability risk.
Jose Luis Garcia-Gervacio
Alejandro Nocua
Víctor H. Champac
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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decision making
randomly distributed
neural network
small number
high risk
network reliability
real time
significantly reduced
defect classification
shortest path
path planning
risk management
risk analysis