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Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits.

Aoxiang TangNiraj K. Jha
Published in: ACM J. Emerg. Technol. Comput. Syst. (2013)
Keyphrases
  • integrated circuit
  • built in self test
  • infrared
  • neural network
  • test data
  • data sets
  • databases
  • machine learning
  • information retrieval
  • expert systems
  • x ray
  • petri net
  • electron beam