An All-Digital, $V_{\mathrm{MAX}}$ -Compliant, Stable, and Scalable Distributed Charge Injection Scheme in 10-nm CMOS for Fast and Local Mitigation of Voltage Droop.
Suyoung BangMinki ChoPascal Andreas MeinerzhagenAndres MalavasiMuhammad M. KhellahJames W. TschanzVivek DePublished in: IEEE J. Solid State Circuits (2020)
Keyphrases
- scalable distributed
- charge coupled device
- low voltage
- power supply
- metal oxide semiconductor
- high speed
- power consumption
- circuit design
- cmos technology
- charge coupled devices
- ccd camera
- cmos image sensor
- digital camera
- metal oxide
- image processing
- design considerations
- risk management
- analog vlsi
- low power
- nm technology