Test data compression using Lingering Component Reduction technique for system-on-a-chip applications.
K. ChakrapaniRajappa MuthaiahPublished in: Comput. Electr. Eng. (2018)
Keyphrases
- test data
- test set
- test cases
- training data
- data compression
- high speed
- printed circuit boards
- training set
- image compression
- search based testing
- training and test data
- error rate
- data sets
- decision trees
- testing process
- object oriented
- relational databases
- feature space
- support vector
- database systems
- databases
- database