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Test compression and logic BIST at your fingertips.

Shianling WuLaung-Terng WangJin Woo ChoZhigang JiangBoryau Sheu
Published in: ITC (2005)
Keyphrases
  • built in self test
  • integrated circuit
  • compression algorithm
  • test cases
  • modal logic
  • data compression
  • programming language
  • image compression
  • compression ratio
  • predicate logic