BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores.
Alireza SarviCarthik A. SharmaRonald F. DeMaraPublished in: ESA (2008)
Keyphrases
- group testing
- disjoint sets
- embedded systems
- field programmable gate array
- fault diagnosis
- high speed
- low cost
- model based diagnosis
- hw sw
- real time image processing
- signal processing
- hardware implementation
- medical diagnosis
- dynamic random access memory
- real time
- parallel hardware
- smart camera
- multi core processors
- hardware design
- fault detection
- low power