Evaluation of the machine learning classifier in wafer defects classification.
Jessnor Arif Mat-JizatAnwar P. P. Abdul MajeedAhmad Fakhri Ab. NasirZahari TahaEdmund YuenPublished in: ICT Express (2021)
Keyphrases
- machine learning
- support vector machine
- decision trees
- feature selection
- classification method
- classification algorithm
- classification process
- classification scheme
- text classification
- supervised classification
- learning vector quantization
- training samples
- pattern recognition
- class labels
- classification rate
- classification models
- machine learning methods
- accurate classification
- machine learning algorithms
- classification accuracy
- feature set
- multiple classifier systems
- high classification accuracy
- learning algorithm
- supervised machine learning
- svm classifier
- classifier combination
- nearest neighbor classifier
- training set
- final classification
- supervised learning
- probabilistic classifiers
- feature construction
- k nearest neighbour
- hierarchical classification
- multi class classifier
- machine learning approaches
- training data
- decision boundary
- multi class
- higher classification accuracy
- bayesian classifier
- accurate classifiers
- classification schemes
- fuzzy classifier
- multiple classifiers
- support vector machine svm
- rule based classifier
- fuzzy support vector machine
- image classification
- feature vectors
- semi supervised learning
- feature space
- support vector
- cost sensitive learning
- data mining
- binary classifiers
- weak classifiers
- pattern classification
- model selection
- extracted features
- feature extraction and classification
- associative classifiers
- ensemble classifier
- multi category
- naive bayes classifier
- nearest neighbour
- knn