MULTIPLE CLASSIFIERS
Experts
- Robert Sabourin
- Robert P. W. Duin
- Ching Y. Suen
- Anthony J. Bagnall
- Mita Nasipuri
- Josef Kittler
- Loris Nanni
- Alexandros Iosifidis
- Ram Sarkar
- Michal Wozniak
- Mahantapas Kundu
- Hee-Joong Kang
- Moncef Gabbouj
- Seong-Whan Lee
- Fabio Roli
- Alceu de Souza Britto Jr.
- Dipak Kumar Basu
- Malayappan Shridhar
- Boguslaw Cyganek
- Cheng-Lin Liu
- Fumitaka Kimura
- João Marques de Carvalho
- Nibaran Das
- Subhadip Basu
- David M. J. Tax
- Mohamed S. Kamel
- Guang-Bin Huang
- Fahad Sohrab
- Claudio De Stefano
- Jenni Raitoharju
- Brijesh K. Verma
- Ludmila I. Kuncheva
- Michael C. Fairhurst
- Plamen P. Angelov
- Luiz S. Oliveira
- Xiaoqing Ding
- Hadi Sadoghi Yazdi
- Agapito Ledezma
- Elzbieta Pekalska
Venues
- CoRR
- Pattern Recognit.
- IEEE Access
- IJCNN
- ICPR
- ICDAR
- Pattern Recognit. Lett.
- ICASSP
- Expert Syst. Appl.
- Sensors
- Neurocomputing
- Multim. Tools Appl.
- Appl. Soft Comput.
- Neural Comput. Appl.
- EMBC
- INTERSPEECH
- Multiple Classifier Systems
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICML
- SMC
- Inf. Sci.
- FUZZ-IEEE
- CVPR
- NeurIPS
- Remote. Sens.
- MCS
- BMC Bioinform.
- Knowl. Based Syst.
- Pattern Anal. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- ECAI
- IEEE Trans. Neural Networks
- Neural Process. Lett.
- Comput. Biol. Medicine
- Biomed. Signal Process. Control.
- AAAI
- SSPR/SPR
- ICDM
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