MULTIPLE CLASSIFIERS
Experts
- Robert Sabourin
- Robert P. W. Duin
- Ching Y. Suen
- Mita Nasipuri
- Josef Kittler
- Anthony J. Bagnall
- Loris Nanni
- Alexandros Iosifidis
- Mahantapas Kundu
- Ram Sarkar
- Moncef Gabbouj
- Michal Wozniak
- Hee-Joong Kang
- Malayappan Shridhar
- João Marques de Carvalho
- Fabio Roli
- Dipak Kumar Basu
- Nibaran Das
- Seong-Whan Lee
- Cheng-Lin Liu
- Boguslaw Cyganek
- Alceu de Souza Britto Jr.
- Fumitaka Kimura
- Subhadip Basu
- David M. J. Tax
- Fahad Sohrab
- Brijesh K. Verma
- Guang-Bin Huang
- Mohamed S. Kamel
- Ludmila I. Kuncheva
- Jenni Raitoharju
- Claudio De Stefano
- Giorgio Corani
- Ujjwal Bhattacharya
- Elzbieta Pekalska
- Alessandra Lumini
- Xiaoqing Ding
- Plamen P. Angelov
- Michael C. Fairhurst
Venues
- CoRR
- Pattern Recognit.
- IEEE Access
- IJCNN
- ICPR
- ICDAR
- Pattern Recognit. Lett.
- ICASSP
- Sensors
- Neurocomputing
- Expert Syst. Appl.
- EMBC
- Appl. Soft Comput.
- Neural Comput. Appl.
- Multim. Tools Appl.
- Multiple Classifier Systems
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- INTERSPEECH
- SMC
- ICML
- FUZZ-IEEE
- MCS
- NeurIPS
- Inf. Sci.
- CVPR
- Remote. Sens.
- BMC Bioinform.
- ECAI
- Int. J. Pattern Recognit. Artif. Intell.
- Pattern Anal. Appl.
- Neural Process. Lett.
- IEEE Trans. Neural Networks
- SSPR/SPR
- Knowl. Based Syst.
- ICDM
- SIU
- ICCCNT
- ICIP
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