MULTIPLE CLASSIFIERS
Experts
- Robert Sabourin
- Robert P. W. Duin
- Ching Y. Suen
- Mita Nasipuri
- Anthony J. Bagnall
- Josef Kittler
- Loris Nanni
- Alexandros Iosifidis
- Michal Wozniak
- Mahantapas Kundu
- Hee-Joong Kang
- Moncef Gabbouj
- Ram Sarkar
- Nibaran Das
- Dipak Kumar Basu
- Malayappan Shridhar
- Fumitaka Kimura
- Boguslaw Cyganek
- Alceu de Souza Britto Jr.
- Seong-Whan Lee
- Fabio Roli
- João Marques de Carvalho
- Cheng-Lin Liu
- David M. J. Tax
- Jenni Raitoharju
- Ludmila I. Kuncheva
- Guang-Bin Huang
- Subhadip Basu
- Brijesh K. Verma
- Mohamed S. Kamel
- Claudio De Stefano
- Fahad Sohrab
- Ujjwal Bhattacharya
- Alessandra Lumini
- Hadi Sadoghi Yazdi
- James Large
- Xiaoqing Ding
- Majid Ahmadi
- Giorgio Corani
Venues
- CoRR
- Pattern Recognit.
- IEEE Access
- IJCNN
- ICPR
- ICDAR
- Pattern Recognit. Lett.
- ICASSP
- Expert Syst. Appl.
- Sensors
- Neurocomputing
- Multim. Tools Appl.
- Appl. Soft Comput.
- EMBC
- Neural Comput. Appl.
- Multiple Classifier Systems
- INTERSPEECH
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICML
- SMC
- Inf. Sci.
- FUZZ-IEEE
- NeurIPS
- CVPR
- Remote. Sens.
- MCS
- BMC Bioinform.
- Knowl. Based Syst.
- Pattern Anal. Appl.
- ECAI
- Int. J. Pattern Recognit. Artif. Intell.
- Neural Process. Lett.
- IEEE Trans. Neural Networks
- SSPR/SPR
- AAAI
- Comput. Biol. Medicine
- Biomed. Signal Process. Control.
- ICDM
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