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Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations.

A.-K. TiedemannK. KurzM. FakhriR. HeiderhoffJ. C. H. PhangL. J. Balk
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • finite element
  • finite element analysis
  • image analysis
  • numerical simulations
  • failure rate
  • mesh generation