K. Kurz

Publication Activity (10 Years)

Years Active: 2009-2009
Publications (10 Years): 0

Publications

A.-K. Tiedemann, K. Kurz, M. Fakhri, R. Heiderhoff, J. C. H. Phang, L. J. Balk
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations. Microelectron. Reliab. 49 (9-11) (2009)