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Accelerating the compaction of test sequences in sequential circuits through problem size reduction.
Michael G. Dimopoulos
Panagiotis Linardis
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
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test sequences
test cases
bit rate
test generation
video sequences
high speed
three dimensional
computational complexity
high quality
software engineering
database
feature extraction
case study
computer vision
machine learning
databases
data sets