Built-in Self-Test Circuits for All-digital Phase-Locked Loops.

Ching-Che Chung Wei-Jung Chu Yi-Ting Tsai

Published in: ICCE-TW (2019)

Keyphrases

built in self test
phase locked
integrated circuit
circuit design
high speed
artificial intelligence
vlsi circuits
digital circuits
digital video
digital content
digital media
learning environment
power dissipation
digital world
mixed signal
multi agent
lateral inhibition
multimedia
neural network