A scalable method for the generation of small test sets.
Santiago RemersaroJanusz RajskiSudhakar M. ReddyIrith PomeranzPublished in: DATE (2009)
Keyphrases
- test set
- error rate
- generation method
- significant improvement
- experimental evaluation
- high accuracy
- detection method
- high precision
- support vector machine svm
- feature set
- image sequences
- probabilistic model
- pairwise
- support vector machine
- computational cost
- input data
- unsupervised learning
- clustering method
- training set
- preprocessing
- computational complexity
- training data
- data sets