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Characterizing the impact of process variation on 45 nm NoC-based CMPs.

Carles HernándezAntoni RocaJosé FlichFederico SillaJosé Duato
Published in: J. Parallel Distributed Comput. (2011)
Keyphrases
  • data sets
  • neural network
  • learning algorithm
  • information systems
  • e learning
  • multiscale
  • data streams