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Analysis of Fault Detection Probability of CMOS Combinational Circuits and Its Application to Signature Testing.

Kazuhiko Iwasaki
Published in: Systems and Computers in Japan (1990)
Keyphrases
  • fault detection
  • low cost
  • high speed
  • machine learning
  • asynchronous circuits
  • delay insensitive
  • knowledge base
  • control system
  • management system
  • fault diagnosis
  • failure detection
  • fuel cell