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Toward a portable, self-administered critical flicker frequency test.

Ravi KarkarRafal KocielnikXiaoyi ZhangJames FogartyGeorge N. IoannouSean A. MunsonJasmine Zia
Published in: UbiComp Adjunct (2016)
Keyphrases
  • databases
  • machine learning
  • real time
  • three dimensional
  • computer science
  • expert systems
  • lightweight
  • statistical tests
  • database systems
  • training data
  • data structure
  • search algorithm
  • test cases
  • test data