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Fast and Efficient Constraint Evaluation of Analog Layout Using Machine Learning Models.

Tonmoy DharJitesh PoojaryYaguang LiKishor KunalMeghna MadhusudanArvind K. SharmaSusmita Dey ManasiJiang HuRamesh HarjaniSachin S. Sapatnekar
Published in: ASP-DAC (2021)
Keyphrases
  • machine learning models
  • evolutionary algorithm
  • data sets
  • neural network
  • real world
  • machine learning
  • image classification
  • naive bayes
  • spam filtering