Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection.

Chuan-Yu Chang Hung-Jen Wang Si-Yan Lin

Published in: IEA/AIE (2006)

Keyphrases

simulation study
hopfield neural network
defect detection
cellular neural networks
monte carlo
automated visual inspection
energy function
neural network
genetic algorithm
exponential stability
quality control
learning rules
inverted pendulum
computer vision
interior point methods
lyapunov function