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The Future of Design for Test and Silicon Lifecycle Management.
Janusz Rajski
Vivek Chickermane
Jean-François Côté
Stephan Eggersglüß
Nilanjan Mukherjee
Jerzy Tyszer
Published in:
IEEE Des. Test (2024)
Keyphrases
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lifecycle management
long term
neural network
high speed
real world
design process
artificial intelligence
engineering design
experimental design