In-line industrial contaminants discrimination for the packaging sorting based on near-infrared reflectance spectroscopy: A proof of concept.
Manuele BonaccorsiGiovanni RateniFilippo CavalloPaolo DarioPublished in: IEEE SENSORS (2017)
Keyphrases
- vis nir
- spectral data
- least squares support vector machine
- spectral reflectance
- reflectance spectra
- high speed
- single image
- partial least squares
- x ray
- photometric stereo
- line segments
- high density
- industrial applications
- hyperspectral
- color constancy
- ls svm
- object surface
- cross section
- shape from shading
- visible light
- multispectral