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Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Faults.
R. K. Sharma
Aditi Sood
Published in:
ICSAP (2010)
Keyphrases
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built in self test
discrete event simulation
integrated circuit
simulation study
simulation environment
genetic algorithm
fault diagnosis
main memory
memory requirements
modeling language
memory usage
computing power
random access
test cases
real time
simulation models
information systems