X-ray image classification using Random Forests with Local Binary Patterns.
Seong-Hoon KimJi-Hyun LeeByoungChul KoJae-Yeal NamPublished in: ICMLC (2010)
Keyphrases
- random forests
- x ray
- local binary pattern
- image classification
- feature extraction
- texture classification
- face recognition
- random forest
- multiscale
- digital x ray images
- texture analysis
- logistic regression
- decision trees
- ensemble methods
- rotation invariant
- texture features
- machine learning algorithms
- x ray images
- spatial information
- three dimensional
- multi label
- image features
- background subtraction
- image representation
- face detection
- feature set
- image analysis
- pattern recognition
- gabor filters
- sparse representation
- data mining
- feature space
- feature vectors
- texture images
- image segmentation
- prediction accuracy