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On Designing Robust Path-Delay Fault Testable Combinational Circuits Based on Functional Properties.
Rupali Mitra
Debesh K. Das
Bhargab B. Bhattacharya
Published in:
ISVLSI (2014)
Keyphrases
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functional properties
computationally efficient
high speed
asynchronous circuits
data sets
xml documents
sufficient conditions
fault diagnosis
boolean functions
fault detection
bi decomposition