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A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash.

Aijiao CuiMengyang LiGang QuHuawei Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • test data
  • training data
  • test set
  • test cases
  • hash functions
  • database
  • smart card
  • security protocols
  • training and test data