Sign in

Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack.

Kaushik VaidyanathanBishnu P. DasLarry T. Pileggi
Published in: DAC (2014)
Keyphrases
  • high speed
  • integrated circuit
  • countermeasures
  • real time
  • data mining
  • test cases
  • structural equation modeling
  • reliability analysis