Data Mining Integrated Circuit Fails with Fail Commonalities.
Leendert M. HuismanMaroun KassabLeah PastelPublished in: ITC (2004)
Keyphrases
- integrated circuit
- data mining
- knowledge discovery
- data mining techniques
- intrusion detection
- hardware description language
- electron beam
- data mining algorithms
- real time
- web mining
- data mining methods
- real world
- low cost
- rough sets
- decision support
- association rule mining
- computer science
- outlier detection
- cluster analysis
- web intelligence
- decision trees
- machine learning